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Automated Design Verification Testing for RF Connectivity and Cellular Standards
Make Testing a Differentiator for your Product
WiDVT is a comprehensive, out-of-the-box solution covering all phases of design verification and production testing for RF connectivity and cellular standards. With its parallel test methodology and integrated data management and analysis capabilities, WiDVT can dramatically reduce test time.
Top 5 Reasons for which Design Verification Teams Choose WiDVT
- Manage all your test conditions and create hundreds of test steps with automated sequence generator
- Select from industry standards or your own custom measurements
- Distribute testing on optimal instrumentation platforms and multiple testers with a central storage for all data
- Complete traceability of each measurement
- Turn test data to design feedback with user defined reports
Production Test Capabilities
WiPro Module
- Limits and Stop on Fail Settings for Measurements
- Pareto and Process Capability Charts
- Parallel Test
- Handler
- Load Board
- Port Module
Complete your Test Automation with Best Data Management and Analysis Features.
Analysis Capabilities
- Dedicated Database Servers
- Multi-site Test Data Collection
- Data Import and Export
- Masking and Filtering
- Report Generation
- Statistical Analysis
Multiple Hardware Platforms within same Automation Framework
VISA Based
Bench Top Instruments from Keysight Technologies, R&S, Tektronics, and Anritsu
PXI
PXI VST, VSA and VSG from National Instruments, Keysight, Aeroflex and LitePoint
Other Instruments
VNA, Noise Figure, Device Programming and Other ATE Peripheral Components
Deploy WiDVT for a New Tester in Minutes
A Single Installer
- Drivers
- Tools and Utilities
- Support APIs
- Database
- Measurement Modules
- Help and Procedure files
Training and Support
- Get your team trained with hands on experience
- Simulated test functionality for all platforms when installed on windows
- Analyze data on non-tester work station
WLAN Measurements
- EVM
- SPECTRAL MASK
- GAIN
- S PARAMETER
- NOISE FIGURE
- HARMONICS
- ACP
- CARRIER LEAKAGE
- FREQUENCY OFFSET
- IP3
- P1dB
- BANDEDGE
- LOAD PULL
- DC Voltages and Currents
- MANY MORE
Bluetooth Measurements
Tx Power Measurements
- Maximum Output Power
- Maximum Power Density
- Power Control
- EDR-Relative Transmit Power
Tx Spectral Measurements
- 20 dB Bandwidth
- Frequency Range
- Adjacent Channel Power
- In-Band Spurious Emission
- Out-of-Band Spurious Emission
Tx Modulation Measurements
- Modulation Characteristics (Frequency Deviation)
- Initial Carrier Frequency Error
- Carrier Frequency Drift
- EDR-Carrier Frequency Stability
- EDR-Differential Phase Encoding
- EDR-Differential Error Vector Magnitude (Modulation Accuracy)
Rx Measurements
- Sensitivity
- C/I Performance
- Intermodulation
- Max Usable Level
- EDR-Bit Error Rate (BER) Floor Performance
NFC Measurements
Device Connectivity
- Resonance Sweep
- Initialization Procedure
Tx Measurements
- Field Strength
- Frequency Accuracy
- Modulation Depth/Index/Timing
- Payload Data
- CRC Error
Rx Measurements
- Target Frame Delay
- Modulation Depth/Index/Timing
- Rx Sensitivity
- Payload Data
- CRC Error
LTE Measurements
Tx Modulation Measurements
- Error Vector Magnitude (Channel RMS EVM, EVM per Symbol, EVM per Subcarrier, EVM per
- Symbol per Subcarrier, EVM per Slot, EVM per RB)
- Time Mask
- In-band emissions for non allocated Resource Blocks
Tx Spectral Measurements
- Channel Power
- Adjacent Channel Power
- Occupied Bandwidth
- Spectral Emission Mask
- Carrier LeakageFrequency Error
Rx Measurements
- RX BER
- RSSI
PvT Measurements
- Burst Width
- Rampup and Rampdown Times
- Average Transmit ON/Off Powers
CCDF Measurements
- Peak to Average Power Ratio
- Average Power