Automated Design Verification Testing for RF Connectivity and Cellular Standards


Make Testing a Differentiator for your Product

WiDVT is a comprehensive, out-of-the-box solution covering all phases of design verification and production testing for RF connectivity and cellular standards. With its parallel test methodology and integrated data management and analysis capabilities, WiDVT can dramatically reduce test time.

Top 5 Reasons for which Design Verification Teams Choose WiDVT

  1. Manage all your test conditions and create hundreds of test steps with automated sequence generator
  2. Select from industry standards or your own custom measurements
  3. Distribute testing on optimal instrumentation platforms and multiple testers with a central storage for all data
  4. Complete traceability of each measurement
  5. Turn test data to design feedback with user defined reports

Production Test Capabilities

WiPro Module

  1. Limits and Stop on Fail Settings for Measurements
  2. Pareto and Process Capability Charts
  3. Parallel Test
  4. Handler
  5. Load Board
  6. Port Module

Complete your Test Automation with Best Data Management and Analysis Features.

Analysis Capabilities

  1. Dedicated Database Servers
  2. Multi-site Test Data Collection
  3. Data Import and Export
  4. Masking and Filtering
  5. Report Generation
  6. Statistical Analysis

Multiple Hardware Platforms within same Automation Framework

VISA Based

Bench Top Instruments from Keysight Technologies, R&S, Tektronics, and Anritsu


PXI VST, VSA and VSG from National Instruments, Keysight, Aeroflex and LitePoint

Other Instruments

VNA, Noise Figure, Device Programming and Other ATE Peripheral Components

Deploy WiDVT for a New Tester in Minutes

A Single Installer

  • Drivers
  • Tools and Utilities
  • Support APIs
  • Database
  • Measurement Modules
  • Help and Procedure files

Training and Support

  • Get your team trained with hands on experience
  • Simulated test functionality for all platforms when installed on windows
  • Analyze data on non-tester work station

WLAN Measurements

  • EVM
  • GAIN
  • ACP
  • IP3
  • P1dB
  • DC Voltages and Currents

Bluetooth Measurements

Tx Power Measurements

  • Maximum Output Power
  • Maximum Power Density
  • Power Control
  • EDR-Relative Transmit Power

Tx Spectral Measurements

  • 20 dB Bandwidth
  • Frequency Range
  • Adjacent Channel Power
  • In-Band Spurious Emission
  • Out-of-Band Spurious Emission

Tx Modulation Measurements

  • Modulation Characteristics (Frequency Deviation)
  • Initial Carrier Frequency Error
  • Carrier Frequency Drift
  • EDR-Carrier Frequency Stability
  • EDR-Differential Phase Encoding
  • EDR-Differential Error Vector Magnitude (Modulation Accuracy)

Rx Measurements

  • Sensitivity
  • C/I Performance
  • Intermodulation
  • Max Usable Level
  • EDR-Bit Error Rate (BER) Floor Performance

NFC Measurements

Device Connectivity

  • Resonance Sweep
  • Initialization Procedure

Tx Measurements

  • Field Strength
  • Frequency Accuracy
  • Modulation Depth/Index/Timing
  • Payload Data
  • CRC Error

Rx Measurements

  • Target Frame Delay
  • Modulation Depth/Index/Timing
  • Rx Sensitivity
  • Payload Data
  • CRC Error

LTE Measurements

Tx Modulation Measurements

  • Error Vector Magnitude (Channel RMS EVM, EVM per Symbol, EVM per Subcarrier, EVM per
  • Symbol per Subcarrier, EVM per Slot, EVM per RB)
  • Time Mask
  • In-band emissions for non allocated Resource Blocks

Tx Spectral Measurements

  • Channel Power
  • Adjacent Channel Power
  • Occupied Bandwidth
  • Spectral Emission Mask
  • Carrier LeakageFrequency Error

Rx Measurements

  • RX BER
  • RSSI

PvT Measurements

  • Burst Width
  • Rampup and Rampdown Times
  • Average Transmit ON/Off Powers

CCDF Measurements

  • Peak to Average Power Ratio
  • Average Power